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Single-event upset
change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors
Pronunciation
/ˈsɪŋɡəl - ɪˈvɛnt ˈʌpsɛt/
/ˈsɪŋɡəl - əˈvɛnt ˌəpˈsɛt/
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